The solution harnesses the company's contextual knowledge of the semiconductor industry and the power of deep learning tech, to help chip makers digitally re-imagine their product quality assurance process. Sophisticated quality inspection of wafers during the semiconductor manufacturing process is essential to detect and classify defects early and accurately, TCS said.
from Tech-Economic Times
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Tuesday 5 May 2020
TCS launches AI-powered solution to detect wafer anomaly in semiconductor manufacturing
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